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Index ellipsoid

The index ellipsoid, also known as the optical indicatrix or Fresnel ellipsoid, is a geometric construction in crystal optics that represents the directional dependence of the refractive index in anisotropic materials, enabling the determination of light propagation characteristics such as birefringence and polarization states.^[1]^[2]^[3] Introduced by Augustin-Jean Fresnel in 1821 as part of his wave theory of light, the concept originally described an "ellipsoid of elasticity" in the luminiferous ether to explain double refraction in crystals, linking ray velocities to polarization directions via cross-sections of the ellipsoid.^[4] In modern electromagnetic theory, it is derived from the dielectric tensor of the material, with the principal axes aligned to the directions of maximum and minimum permittivity, where the refractive indices n_i relate to the relative permittivities by n_i = \sqrt{\varepsilon_i / \varepsilon_0}.^[5] The ellipsoid is defined by the equation \frac{x^2}{n_x^2} + \frac{y^2}{n_y^2} + \frac{z^2}{n_z^2} = 1, where the semi-axes lengths n_x, n_y, and n_z correspond to the principal refractive indices along the coordinate axes.^[5]^[6] For a given propagation direction, a plane through the origin perpendicular to the wave vector intersects the ellipsoid to form an index ellipse, whose major and minor axes yield the refractive indices and vibration directions for the ordinary and extraordinary (or fast and slow) polarized waves, respectively.^[1]^[2] In isotropic materials, such as cubic crystals, the index ellipsoid degenerates into a sphere with a single refractive index n, indicating uniform light speed in all directions.^[6] Uniaxial crystals, common in minerals like quartz or calcite, feature two equal principal indices (n_o = n_x = n_y) and a distinct extraordinary index n_e = n_z along the optic axis; the ellipsoid is then a spheroid, classified as positive if n_e > n_o or negative if n_e < n_o.^[5] Biaxial crystals, such as topaz, have three distinct indices (n_x \neq n_y \neq n_z), resulting in a triaxial ellipsoid with two optic axes, complicating light propagation with three possible refractive indices depending on direction.^[5]^[6] This construct is fundamental in applications like polarized light microscopy for analyzing crystal birefringence, nonlinear optics for wave mixing in anisotropic media, and the design of optical devices such as waveplates and polarizers.^[2]^[1] It also connects to dispersion relations, where the ellipsoid's shape influences the wave vector surfaces, determining phase and group velocities in photonic materials.^[6]

Fundamentals

Definition and Geometry

The index ellipsoid serves as a fundamental geometric tool in crystal optics for visualizing the directional dependence of refractive indices in anisotropic media. It is constructed as a three-dimensional ellipsoid aligned with the principal axes of the material, where these axes correspond to the directions in which the dielectric tensor is diagonalized. The ellipsoid encapsulates the anisotropy by varying in shape according to the material's optical properties, providing an intuitive means to analyze light propagation without relying on tensor algebra directly.^[5] The geometry of the index ellipsoid facilitates the determination of refractive indices for any propagation direction through sectional analysis. Specifically, a plane passing through the origin and perpendicular to the wave normal (propagation direction) intersects the ellipsoid surface to form an ellipse. The semi-axes of this elliptical cross-section represent the magnitudes of the refractive indices for the two orthogonal linear polarization states allowed in that direction, while the orientations of these semi-axes indicate the corresponding polarization directions. This construction also reveals phase velocities, as they are inversely proportional to the refractive indices along those polarizations, enabling prediction of wave behavior such as birefringence.^[7] The lengths of the ellipsoid's principal semi-axes equal the principal refractive indices n_x, n_y, and n_z, such that the extent along each axis reflects the material's birefringence along that direction. In cases of high symmetry, such as uniaxial crystals, the ellipsoid becomes a spheroid with two equal semi-axes. For isotropic media, where n_x = n_y = n_z = n, the structure degenerates into a sphere of radius n, signifying uniform refractive index independent of direction or polarization.^[5]

Mathematical Formulation

The index ellipsoid in principal coordinates is defined by the quadratic equation

\frac{x^2}{n_x^2} + \frac{y^2}{n_y^2} + \frac{z^2}{n_z^2} = 1,

where n_x, n_y, and n_z are the principal refractive indices along the x, y, and z axes, respectively.^[5] This form represents an ellipsoid whose semi-axes lengths are equal to the principal refractive indices, providing a geometric depiction of the medium's optical anisotropy.^[8] This equation emerges from the dispersion relation derived from Maxwell's equations in anisotropic media. For plane waves \mathbf{E} = \mathbf{E}_0 e^{j(\omega t - \mathbf{k} \cdot \mathbf{r})}, the wave equation \nabla \times \nabla \times \mathbf{E} = \omega^2 \mu_0 \boldsymbol{\epsilon} \mathbf{E} simplifies to \mathbf{k} \times (\mathbf{k} \times \mathbf{E}_0) + \omega^2 \mu_0 \boldsymbol{\epsilon} \mathbf{E}_0 = 0, or in matrix form, k^2 (\mathbf{\hat{s}} \cdot \mathbf{\hat{s}}) \mathbf{E}_0 - k^2 (\mathbf{\hat{s}} \cdot \mathbf{E}_0) \mathbf{\hat{s}} = k_0^2 \boldsymbol{\epsilon}_r \mathbf{E}_0, where \mathbf{\hat{s}} = \mathbf{k}/k is the unit wave vector, k_0 = \omega / c, and \boldsymbol{\epsilon}_r is the relative permittivity tensor.^[6] Assuming principal coordinates where \boldsymbol{\epsilon}_r is diagonal with elements \epsilon_x = n_x^2, \epsilon_y = n_y^2, \epsilon_z = n_z^2, solving the resulting eigenvalue problem yields the index ellipsoid equation, which geometrically represents the possible solutions for the refractive indices and polarizations.^[8] In arbitrary coordinates, the index ellipsoid takes the general quadratic form x_i (\boldsymbol{\epsilon}_r^{-1})_{ij} x_j = 1, where \boldsymbol{\epsilon}_r^{-1} is the inverse relative permittivity tensor (impermeability tensor).^[9] This tensorial representation accounts for off-diagonal elements arising from crystal orientation, allowing transformation via rotation matrices to diagonalize it into the principal form. This property facilitates determination of birefringence and polarization states from sectional ellipses perpendicular to \mathbf{s}.^[9]

Classifications and Properties

Uniaxial and Biaxial Distinctions

The distinctions between uniaxial and biaxial forms of the index ellipsoid arise from the symmetry of the crystal structure, which determines the equality or inequality of the principal refractive indices and thus the geometric shape and optical properties of the ellipsoid.^[10]^[11] In uniaxial crystals, which occur in tetragonal or hexagonal symmetry classes, two principal refractive indices are equal, denoted as the ordinary index n_o for polarizations perpendicular to the optic axis and the extraordinary index n_e along the unique optic axis direction.^[10]^[5] This equality results in a spheroid—an ellipsoid of revolution—with rotational symmetry around the optic axis, leading to isotropic behavior in the plane perpendicular to this axis.^[8] Uniaxial crystals are further classified as positive if n_e > n_o or negative if n_e < n_o, affecting the elongation of the spheroid along the optic axis.^[5] In contrast, biaxial crystals, found in orthorhombic, monoclinic, or triclinic symmetry classes, exhibit three distinct principal refractive indices n_\alpha < n_\beta < n_\gamma, producing a triaxial ellipsoid without rotational symmetry and featuring two optic axes that lie in the plane of n_\alpha and n_\gamma.^[11]^[8] These optic axes are directions along which the ellipsoid's cross-sections are circular, but unlike the uniaxial case, they are not aligned with the principal axes.^[12] A fundamental optical distinction lies in the ellipsoid's cross-sections, which determine birefringence for light propagation normal to those planes: in uniaxial media, the circular sections perpendicular to the optic axis correspond to directions of no birefringence, as the two refractive indices are identical (n_o); in biaxial media, all such sections are elliptical except along the optic axes, implying inherent birefringence in nearly all propagation directions.^[12]^[13] As crystal symmetry increases to cubic, the isotropic limit is reached where all principal indices are equal (n_x = n_y = n_z = n), causing the index ellipsoid to degenerate into a sphere with uniform refractive index and no birefringence.^[8]^[5]

Principal Refractive Indices

The principal refractive indices, denoted as n_x, n_y, and n_z, are the square roots of the principal relative dielectric constants (\epsilon_x / \epsilon_0, \epsilon_y / \epsilon_0, \epsilon_z / \epsilon_0) along the orthogonal principal axes of the crystal.^[5] These indices correspond to the lengths of the ellipsoid's semi-axes and represent the refractive indices for light polarized parallel to those axes, determining the maximum and minimum phase velocities (v = c / n) within the material.^[14] In anisotropic crystals, the differences among n_x, n_y, and n_z arise from the material's directional dependence on light propagation, with the largest and smallest values defining the extremes of velocity variation.^[12] Experimental determination of these indices typically involves techniques that isolate the ordinary and extraordinary ray behaviors to compute birefringence \Delta n = n_e - n_o. Prism refraction methods use a crystal prism to measure minimum deviation angles for polarized light, yielding individual indices from Snell's law applications.^[15] Interferometry, such as Michelson or Mach-Zehnder setups, quantifies phase shifts induced by the crystal to derive refractive values through optical path length changes.^[16] Ellipsometry assesses polarization state changes upon reflection or transmission, providing precise measurements especially for thin samples or surfaces.^[17] In crystals like quartz, which is uniaxial with n_x = n_y = n_o and n_z = n_e, the indices are approximately n_o = 1.544 and n_e = 1.553 at the sodium D-line wavelength of 589 nm.^[18] These values exhibit dispersion, increasing toward shorter wavelengths (e.g., violet light yields higher n_o and n_e) due to resonant electronic transitions, which modifies the ellipsoid's aspect ratio across the spectrum.^[19] Temperature variations also influence the indices; for quartz, they show a general increase with rising temperature in the alpha phase up to about 846 K, with anomalies near the alpha-beta transition affecting the ellipsoid's shape through thermal expansion and order parameter changes.^[20] The principal refractive indices are fundamentally linked to the crystal's atomic structure, where anisotropic arrangements of atoms and molecules induce direction-dependent polarizability, leading to varying dielectric constants and thus distinct n_x, n_y, and n_z.^[21] This structural anisotropy, such as helical or layered configurations in quartz, modulates electron cloud responses to electric fields, directly scaling the refractive indices along principal directions.^[22]

Historical Context

Fresnel's Derivation

In his 1822 memoir presented to the Académie des Sciences, Augustin-Jean Fresnel derived the mathematical description of light propagation in anisotropic media by extending Christiaan Huygens' principle to account for varying elasticity in crystals. Fresnel modeled the medium as having direction-dependent restoring forces on ether vibrations, leading to an ellipsoidal surface of elasticity whose principal semi-axes a, b, and c represent maximum velocities along the crystal's principal directions. For a wave normal making angles \xi, \eta, and \zeta with these axes, the velocity v of the wave satisfies the equation

v^2 = a^2 \cos^2 \xi + b^2 \cos^2 \eta + c^2 \cos^2 \zeta,

which defines the wave surface in velocity space and governs the two possible polarizations perpendicular to the wave normal.^[23] This formulation provided a key insight into double refraction observed in calcite, a uniaxial crystal where one principal velocity equals another, resulting in two distinct wave surfaces: the ordinary wave surface, a sphere corresponding to isotropic propagation for one polarization, and the extraordinary wave surface, an ellipsoid explaining the direction-dependent velocity for the orthogonal polarization. In calcite, an incident ray splits into these ordinary and extraordinary rays, with the ordinary ray obeying Snell's law as in isotropic media and the extraordinary ray deviating due to the anisotropic velocity, thus accounting for the characteristic double image in birefringent experiments.^[24] Fresnel's analysis resolved the transverse nature of light waves by demonstrating that vibrations must be perpendicular to the propagation direction to explain polarization effects in double refraction, linking the ellipsoid's geometry directly to the observed rotation and extinction of polarized light in crystals. This transverse assumption was crucial, as longitudinal waves could not produce the required two orthogonal polarizations without violating boundary conditions at interfaces.^[24] Although groundbreaking, Fresnel's initial derivation was framed in terms of velocity space tied to the elasticity ellipsoid, limiting direct application to refractive indices until later normalizations transformed it into the modern index ellipsoid form.^[23]

Evolution of Terminology

In 1837, James MacCullagh introduced the term "index surface" to describe the reciprocal of the velocity surface in the context of double refraction in anisotropic media, providing a geometrical framework that complemented Fresnel's earlier wave surface by emphasizing refractive indices rather than wave propagation speeds.^[25] This nomenclature highlighted the surface's role in representing the inverse relationship between refractive index and phase velocity, facilitating clearer analysis of light behavior in crystals. MacCullagh's contribution marked an early refinement in the conceptual tools for crystal optics, shifting focus toward index-based descriptions. By 1891, Lazarus Fletcher coined the term "optical indicatrix" in his work on mineral optics, using it to denote the ellipsoid that encapsulates the principal refractive indices and their orientations within crystalline materials.^[26] Fletcher's terminology, detailed in his treatise on light transmission in crystals, emphasized the indicatrix's utility as a visual and mathematical aid for predicting polarization and refraction directions, particularly in mineralogical studies. This term gained traction in crystallography for its intuitive representation of optical anisotropy. In 20th-century optics literature, the nomenclature evolved from references to "Fresnel's wave surface," which primarily depicted wave normals and velocities, to the more standardized "index ellipsoid," adopted for its direct correspondence to refractive index variations and principal axes. This shift, evident in authoritative texts by the mid-20th century, enhanced clarity in describing birefringence without conflating wave and index properties. The adoption of the index ellipsoid, often interchangeably with the optical indicatrix, profoundly influenced crystallography by enabling precise classification of minerals based on their optical symmetry. For instance, beryl exemplifies uniaxial crystals with two equal ordinary indices and one extraordinary index, resulting in a prolate or oblate ellipsoid aligned with its hexagonal symmetry.^[27] In contrast, topaz represents biaxial minerals with three distinct principal indices, yielding an ellipsoid with two optic axes and facilitating identification through interference figures.^[28] This terminological framework became essential for distinguishing optical classes in mineral analysis, supporting advancements in petrography and gemology.

Physical Foundations

Electromagnetic Relations

The index ellipsoid in anisotropic media arises directly from Maxwell's equations through the constitutive relation \mathbf{D} = \epsilon \mathbf{E}, where \epsilon is the dielectric tensor describing the material's permittivity. For non-magnetic materials (\mu = 1), the principal refractive indices are related to the principal components of the relative permittivity tensor by n_i = \sqrt{\epsilon_i}, with i = x, y, z. This connection stems from the wave equation in anisotropic media, where the phase velocity v_p = c / n depends on the eigenvalues of \epsilon, yielding the index ellipsoid equation \frac{x^2}{n_x^2} + \frac{y^2}{n_y^2} + \frac{z^2}{n_z^2} = 1 in the principal axis frame.^[6]^[29] Substituting n_i^2 = \epsilon_i transforms the index ellipsoid into the impermeability form \frac{x^2}{\epsilon_x} + \frac{y^2}{\epsilon_y} + \frac{z^2}{\epsilon_z} = 1, which geometrically represents the inverse dielectric tensor \eta = \epsilon^{-1}. This form corresponds to the displacement ellipsoid, where the position vector is proportional to \mathbf{D} for a unit magnitude, since \mathbf{E} = \eta \mathbf{D} follows from inverting \mathbf{D} = \epsilon \mathbf{E}. In this representation, the ellipsoid's semi-axes are inversely proportional to those of the index ellipsoid, providing a dual geometric tool for analyzing polarization-dependent responses in crystals. The derivation ensures that for a given propagation direction, the intersection with a plane normal to the wave vector yields the refractive indices for the two orthogonal polarizations.^[30]^[31]^[29] In frequency-dependent media, the dielectric tensor components \epsilon_i(\omega) vary with angular frequency \omega, rendering the index ellipsoid dispersive and wavelength-dependent. This dispersion is modeled using the Sellmeier equation for each principal refractive index, typically of the form n_i^2(\lambda) = 1 + \sum_k \frac{B_k \lambda^2}{\lambda^2 - C_k}, where \lambda is the vacuum wavelength and B_k, C_k are material-specific coefficients fitted to experimental data. For birefringent crystals like quartz or calcite, separate Sellmeier equations describe the ordinary and extraordinary indices, allowing the ellipsoid's shape to be computed across spectral ranges and highlighting variations in birefringence \Delta n = n_e - n_o.^[32] Magneto-optic effects introduce additional distortions to the index ellipsoid when a magnetic field \mathbf{B} is applied, modifying the dielectric tensor with antisymmetric off-diagonal gyrotropic terms proportional to the Verdet constant. This gyration rotates the principal axes of the ellipsoid, effectively tilting it relative to the propagation direction and inducing nonreciprocal birefringence known as the Faraday effect. The rotation angle \theta_F = V B l (where V is the Verdet constant, l the path length) arises from the differing phase velocities for left- and right-circularly polarized light, altering the ellipsoid's symmetry without changing its volume. Such distortions are prominent in materials like yttrium iron garnet (YIG) and enable applications in optical isolators.^[33]^[34]

Connection to Wave Propagation

The index ellipsoid provides a geometric framework for analyzing plane wave propagation in anisotropic crystals by determining the phase velocities, refractive indices, and polarization states for a given propagation direction. For a wave propagating in the unit direction \mathbf{s}, a plane through the origin perpendicular to \mathbf{s} intersects the index ellipsoid, yielding an elliptical cross-section known as the index ellipse. The semimajor and semiminor axes of this ellipse correspond to the two principal refractive indices n_1 and n_2 for the allowed modes, while the orientations of these axes specify the directions of the electric displacement vectors \mathbf{D} (or equivalently, the polarizations) for the ordinary and extraordinary waves, which are mutually orthogonal and lie in the plane normal to \mathbf{s}.^[8] The direction of energy flow, given by the Poynting vector \mathbf{S}, deviates from the phase propagation direction \mathbf{s} in birefringent media, leading to walk-off between the wave vector and the ray path. This walk-off arises because \mathbf{S} is parallel to \mathbf{E} \times \mathbf{H}, and in anisotropic crystals, \mathbf{E} and \mathbf{D} are not collinear with \mathbf{s} for the extraordinary wave. Geometrically, for each mode, the ray direction (Poynting vector) is determined by the normal to the tangent plane at the point on the index ellipsoid where the position vector aligns with the \mathbf{D} direction of length n; this normal coincides with \mathbf{s} only along optic axes, explaining the angular separation \psi between phase and group velocities, with \tan \psi = -\left( \frac{n_o^2}{n_e^2} - 1 \right) \frac{\tan \theta}{1 + \frac{n_o^2}{n_e^2} \tan^2 \theta} for uniaxial crystals at angle \theta to the optic axis.^[8] Refraction at interfaces between isotropic and anisotropic media, or between different anisotropic crystals, follows a generalized form of Snell's law derived from the continuity of the tangential component of the wave vector \mathbf{k}. Using the index ellipsoid, the possible transmitted refractive indices and ray directions are found by constructing the index ellipses for incident and transmitted propagation directions that satisfy k_{i,\parallel} = k_{t,\parallel}, or n_i \sin \alpha_i = n_o \sin \alpha_o = n_e(\alpha_e) \sin \alpha_e, where n_e(\alpha_e) is the direction-dependent extraordinary index from the ellipse semiaxis. This ensures matching of the phase across the boundary while accounting for the two possible transmitted rays (ordinary and extraordinary).^[35] The ray surface, constructed as the polar reciprocal (or inverse) of the index ellipsoid with respect to the unit sphere—effectively transforming the equation to \sum n_i^2 x_i^2 = 1—describes the loci of points reached by energy propagation (group velocity) in unit time, distinguishing it from the phase velocity surface given directly by the index ellipsoid. This separation highlights how phase fronts advance along \mathbf{s} at speed c/n, while energy propagates along the ray direction at the group velocity v_g = \nabla_k \omega, which equals the Poynting vector direction in lossless media.^[7]

Applications and Extensions

In Crystal Optics

In crystal optics, the index ellipsoid serves as a fundamental tool for analyzing birefringence, enabling predictions of double refraction angles in anisotropic materials such as calcite and quartz. For uniaxial crystals like calcite (CaCO₃), the ellipsoid's geometry—characterized by principal refractive indices n_o (ordinary) and n_e (extraordinary)—determines how incident light splits into two orthogonally polarized rays with differing velocities. When light propagates through a calcite prism at an angle to the optic axis, the ordinary ray follows Snell's law with index n_o \approx 1.658, while the extraordinary ray deviates due to its effective index varying as n_e(\theta) = \frac{n_o n_e}{\sqrt{n_o^2 \sin^2 \theta + n_e^2 \cos^2 \theta}}, where \theta is the angle between the propagation direction and the optic axis; this results in observable separation angles, such as the pronounced doubling of images in Iceland spar demonstrations. Similarly, in quartz prisms, the ellipsoid predicts refraction angles for birefringent applications, with n_o \approx 1.544 and n_e \approx 1.553 at visible wavelengths, facilitating quantitative analysis of ray paths without direct computation of tensor components.^[36]^[37]^[5] The index ellipsoid also guides the design of polarization devices, particularly waveplates, by revealing sections that produce desired phase retardations in uniaxial crystals. For a quarter-wave plate, a thin slice of quartz or mica is cut such that the optic axis lies in the plane of the plate, yielding an elliptical section of the ellipsoid with semi-axes corresponding to n_o and n_e for the fast and slow axes, respectively; the plate thickness d is selected such that the retardation \delta = \frac{2\pi}{\lambda} (n_e - n_o) d = \frac{\pi}{2}, converting linear polarization at 45° to the axes into circular polarization. This design exploits the ellipsoid's prolate (for positive uniaxial quartz) or oblate (for negative uniaxial calcite) shape to ensure equal path differences for orthogonal components, with typical thicknesses around 15 μm for quartz and 30–40 μm for mica at visible wavelengths to achieve the quarter-wave shift. Such plates, oriented via the ellipsoid's principal axes, are essential for classical polarimetry, where the predicted phase ensures precise control of polarization states.^[5]^[12]^[38]^[39] A key application in microscopy involves conoscopic figures, where the index ellipsoid's projection yields interference patterns that reveal optic axes in crystal sections. Under convergent polarized light, uniaxial crystals like quartz produce a centered isogyre cross with concentric isochromes in the objective's focal plane, corresponding to the ellipsoid's circular sections perpendicular to the optic axis; the melatope marks the axis direction where birefringence vanishes (both modes experience n_o, despite n_e ≠ n_o), and ring patterns encode maximum retardation along the slow axis. These figures, observed at magnifications up to 40×, allow identification of crystal orientation and sign (positive or negative) by tracing rays back to the ellipsoid's geometry, aiding mineralogical analysis without sectioning multiple planes.^[40] In optics laboratories, physical models of the index ellipsoid are constructed from experimentally measured principal indices to visualize birefringence and wave propagation. Using data from refractometry (e.g., n_o, n_e for quartz via immersion methods), scaled ellipsoids are built with ellipsoidal surfaces or 3D-printed approximations, where semi-axes represent n_x, n_y, n_z; cross-sections through these models demonstrate elliptical polarizations and refraction angles for arbitrary propagation directions. Such hands-on constructions, often employing wire frames or transparent materials, facilitate student understanding of double refraction in prisms and aid in verifying conoscopic predictions by simulating ray traces.^[41]^[37]

Modern Interpretations

In contemporary photonics, the index ellipsoid concept has been extended to metamaterials, where effective permittivity tensors (ε) are engineered to produce tailored ellipsoids that enable phenomena such as negative refraction and cloaking. By designing wire mesh connectivities in three-dimensional structures, researchers can position index ellipsoids at arbitrary nonzero wavevector points within the Brillouin zone, facilitating broadband negative group velocities and anomalous refraction without relying on resonances.^[42] For instance, in-plane connections in double wire arrays create multiple ellipsoids offset from the Γ point, supporting orientation-dependent wave coupling that underpins applications like superlensing and partial invisibility cloaks through transformation optics. In nonlinear optics, the optical Kerr effect induces intensity-dependent distortions of the index ellipsoid via third-order nonlinear susceptibilities (χ^(3)), leading to self-phase modulation in propagating pulses. This arises from the cubic polarization response, where the refractive index becomes n = n_0 + n_2 I, with n_2 proportional to the real part of χ^(3), effectively tilting or elongating the ellipsoid axes for extraordinary waves in anisotropic media. Such distortions enable ultrafast all-optical switching and soliton formation, as demonstrated in birefringent fibers where the modulated ellipsoid alters phase accumulation across polarizations.^[43] Computational modeling has advanced the analysis of index ellipsoid-based structures in liquid crystals through finite-difference time-domain (FDTD) simulations, capturing complex director field variations and defect-induced scattering. These methods solve Maxwell's equations on a Yee grid adapted for uniaxial media, incorporating the local ellipsoid orientation to predict transmission and birefringence in nematic films with twist disclinations.^[44] FDTD reveals optic axis gradients near defects that simpler Berreman matrix approaches overlook, enabling design of liquid-crystal devices for adaptive optics and sensors with enhanced resolution.^[45] Recent 2020s research on hyperbolic metamaterials introduces indefinite index surfaces—hyperboloids with saddle-like geometries—extending beyond traditional positive-definite ellipsoids for broadband absorption. These structures, featuring metallic-dielectric multilayers with opposite-sign permittivity components (e.g., ε_∥ < 0, ε_⊥ > 0), exhibit type-II hyperbolic dispersion that supports high-density states for near-perfect absorption across near-infrared wavelengths. Reconfigurable variants using phase-change materials like Ge₂Sb₂Te₅ achieve tunable absorptance peaks shifting by 500 nm, ideal for dynamic stealth and energy-harvesting applications.^[46]

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[PDF] Linear crystal optics for monochromatic plane waves - AS-Photonics
Suppose we start with the propagation vector parallel to the z axis of the. D-ellipsoid and continuously rotate it in the xz plane until it is parallel to x.
[30]
[PDF] Non-linear Optics I (Electro-optics)
The optical properties of an anisotropic medium can be characterised by a geometric construction called the index ellipsoid where η is the so-called im-.
[31]
[PDF] Electro optic modulator - EM Wave in Anisotropic Medium - PhysLab
The coordinate system for which dielectric tensor is diagonal ... Mixed terms; Principal axes of crystal are no longer principal axes of index ellipsoid.
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Refractive index, birefringence, third-order non-linearity and ...
The optical Sellmeier coefficients were obtained by fitting the refractive index data using a single term equation:(3) n 2 ( λ ) − 1 = S 0 λ 0 2 1 − ( λ 0 / λ ) ...
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[PDF] 6m. Magneto-, Electro-, and Elasto-optic Constants - MIT
cause either rotation of the index ellipsoid or a reduction of its symmetry from cubic or uniaxial to biaxial. The qi, are the stress-optic coefficients ...
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Geometry considered for magneto-optic effects. The index ellipsoid ...
For a given propagation direction z, the intersection of the index ellipsoid with a plane through the origin and normal to z defines an ellipse dashed line. Its ...Missing: tensor | Show results with:tensor
[35]
[PDF] Lecture 8: Light propagation in anisotropic media - FZU
Wave equation: continued. We define effective refractive index: ω. = kc n. Wave equation in the matrix form: ( ). ( ). ( ). 0. 2. 22. 2. 2. 2. 2. 2. 22. 2. 2. 2.
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Birefringence in Calcite Crystals | Nikon's MicroscopyU
This tutorial explores double refraction or birefringence in calcite (calcium carbonate), a colorless, transparent, rhombohedral crystalline salt.
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Light and Color - Optical Birefringence - Molecular Expressions
Nov 13, 2015 · Introduction to Birefringence - Anisotropic crystals, such as quartz, calcite ... index, ellipsoid describes the dielectric properties ...
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Polarized Light Microscopy | Nikon's MicroscopyU
Figure 5 - Refractive Index Ellipsoid. Whenever the specimen is in extinction, the permitted vibration directions of light passing through are parallel with ...
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[PDF] F85/F86/F87 - Grundpraktikum Optik
Apr 14, 2016 · Figure 1: Indicatrix or index-ellipsoid for an uniaxial medium. 4.1 ... Quarter-wave plates give a relative phase shift of π/2 to waves ...
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Metamaterials with index ellipsoids at arbitrary k-points - Nature
May 25, 2018 · Here we propose a new type of metamaterial possessing multiple index ellipsoids centered at arbitrary nonzero k-points.Quasistatic Modes · Forming Closed Equifrequency... · Orientation-Dependent...
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(PDF) Kerr constant and third-order nonlinear optic susceptibility ...
Aug 6, 2025 · We report the determination of the Kerr constant (B) and the real part of the third-order nonlinear optic susceptibility (chi(3)) above the ...
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Computational modeling of the propagation of light through liquid crystals containing twist disclinations based on the finite-difference time-domain method
### Summary of FDTD Simulations for Index Ellipsoid-Based Structures in Liquid Crystals
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Photonic properties of heliconical liquid crystals
Aug 27, 2018 · The standard Yee grid of the FDTD code was adapted for light propagation through liquid crystals: the E and H grids are staggered with regards ...
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https://opg.optica.org/ao/abstract.cfm?uri=ao-44-21-4513